A new reference-free infrared image quality metric for nonuniformity correction

Pablo Meza, ESTEBAN MAURICIO VERA ROJAS, Sebastian E. Godoy, Sergio Torres

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Infrared imaging suffer from an undesired fixed-pattern noise mainly due to the response disparity of the individual detectors in a focal-plane array. Even though this nonuniformity noise can be removed after a blackbody calibration procedure, it tends to reappear due to the intrinsic nature of infrared sensing. Online nonuniformity correction techniques have been employed for denoising and tracking the drift, also avoiding to halt normal camera operations. In this paper, a new reference-free infrared imaging quality metric is presented. The main purpose of the proposed metric is to evaluate the quality of the denoised infrared images in real-time, exchanging the typical need of calibration sources by the knowledge of the fixed-pattern noise statistics. We compare the performance of the proposed metric against standard reference-based and reference-free metrics, using a variety of real-time nonuniformity correction techniques. Results show that the new metric is able to track the nonuniformity correction performance, constantly evaluating the quality of the denoised infrared image sequences.

Original languageEnglish
Title of host publicationWMSCI 2010 - The 14th World Multi-Conference on Systemics, Cybernetics and Informatics, Proceedings
Pages98-103
Number of pages6
StatePublished - 1 Dec 2010
Event14th World Multi-Conference on Systemics, Cybernetics and Informatics, WMSCI 2010 - Orlando, FL, United States
Duration: 29 Jun 20102 Jul 2010

Publication series

NameWMSCI 2010 - The 14th World Multi-Conference on Systemics, Cybernetics and Informatics, Proceedings
Volume2

Conference

Conference14th World Multi-Conference on Systemics, Cybernetics and Informatics, WMSCI 2010
CountryUnited States
CityOrlando, FL
Period29/06/102/07/10

Keywords

  • Image Enhacement
  • Image Quality Index
  • Infrared Focal Plane Arrays
  • Infrared Imaging Systems
  • Nonuniformity Correction

Fingerprint Dive into the research topics of 'A new reference-free infrared image quality metric for nonuniformity correction'. Together they form a unique fingerprint.

Cite this