TY - GEN
T1 - A new reference-free infrared image quality metric for nonuniformity correction
AU - Meza, Pablo
AU - Vera, Esteban
AU - Godoy, Sebastian E.
AU - Torres, Sergio
PY - 2010
Y1 - 2010
N2 - Infrared imaging suffer from an undesired fixed-pattern noise mainly due to the response disparity of the individual detectors in a focal-plane array. Even though this nonuniformity noise can be removed after a blackbody calibration procedure, it tends to reappear due to the intrinsic nature of infrared sensing. Online nonuniformity correction techniques have been employed for denoising and tracking the drift, also avoiding to halt normal camera operations. In this paper, a new reference-free infrared imaging quality metric is presented. The main purpose of the proposed metric is to evaluate the quality of the denoised infrared images in real-time, exchanging the typical need of calibration sources by the knowledge of the fixed-pattern noise statistics. We compare the performance of the proposed metric against standard reference-based and reference-free metrics, using a variety of real-time nonuniformity correction techniques. Results show that the new metric is able to track the nonuniformity correction performance, constantly evaluating the quality of the denoised infrared image sequences.
AB - Infrared imaging suffer from an undesired fixed-pattern noise mainly due to the response disparity of the individual detectors in a focal-plane array. Even though this nonuniformity noise can be removed after a blackbody calibration procedure, it tends to reappear due to the intrinsic nature of infrared sensing. Online nonuniformity correction techniques have been employed for denoising and tracking the drift, also avoiding to halt normal camera operations. In this paper, a new reference-free infrared imaging quality metric is presented. The main purpose of the proposed metric is to evaluate the quality of the denoised infrared images in real-time, exchanging the typical need of calibration sources by the knowledge of the fixed-pattern noise statistics. We compare the performance of the proposed metric against standard reference-based and reference-free metrics, using a variety of real-time nonuniformity correction techniques. Results show that the new metric is able to track the nonuniformity correction performance, constantly evaluating the quality of the denoised infrared image sequences.
KW - Image Enhacement
KW - Image Quality Index
KW - Infrared Focal Plane Arrays
KW - Infrared Imaging Systems
KW - Nonuniformity Correction
UR - http://www.scopus.com/inward/record.url?scp=84870231526&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84870231526
SN - 9781934272992
T3 - WMSCI 2010 - The 14th World Multi-Conference on Systemics, Cybernetics and Informatics, Proceedings
SP - 98
EP - 103
BT - WMSCI 2010 - The 14th World Multi-Conference on Systemics, Cybernetics and Informatics, Proceedings
T2 - 14th World Multi-Conference on Systemics, Cybernetics and Informatics, WMSCI 2010
Y2 - 29 June 2010 through 2 July 2010
ER -