Effect of annealing temperature on the structural, morphological and optical properties of ThO₂ thin films grown by photochemical metal–organic deposition

Engineering & Materials Science

• Optical properties 100%
• Structural properties 87%
• Annealing 79%
• Thin films 75%
• Temperature 32%
• Atomic force microscopy 20%
• Quartz 17%
• X ray diffraction 15%
• Spectroscopic ellipsometry 14%
• Surface roughness 13%
• Crystallite size 11%
• Diffraction patterns 11%
• Thorium 11%
• Refractive index 10%
• X ray photoelectron spectroscopy 9%
• Energy gap 9%
• Spectroscopy 8%
• Diffraction 8%
• Wavelength 7%
• Silicon 6%
• Substrates 5%
• Hot Temperature 3%

Physics & Astronomy

• optical properties 52%
• annealing 48%
• thin films 41%
• temperature 23%
• quartz 14%
• surface roughness 13%
• transmittance 13%
• atomic force microscopy 12%
• x rays 10%
• thorium 10%
• diffraction 8%
• ellipsometry 7%
• reflectors 7%
• crystallites 7%
• diffraction patterns 6%
• photoelectron spectroscopy 6%
• refractivity 5%
• silicon 4%
• spectroscopy 4%
• wavelengths 3%

Chemistry

• Annealing 63%
• Optical Property 58%
• Liquid Film 38%
• Surface Roughness 16%
• Transmittance 16%
• Quartz 14%
• Atomic Force Microscopy 12%
• Thorium 9%
• Ellipsometry 8%
• X-Ray Diffraction 7%
• Refractive Index 7%
• Crystallite 6%
• Cubic Space Group 6%
• Wavelength 5%
• X-Ray Photoelectron Spectroscopy 5%
• Spectroscopy 5%
• Energy 3%
• Surface 2%