Joint de-blurring and nonuniformity correction method for infrared microscopy imaging

Anselmo Jara, Sergio Torres, Guillermo Machuca, Wagner Ramírez, Pablo A. Gutiérrez, Laura A. Viafora, Sebastián E. Godoy, Esteban Vera

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


In this work, we present a new technique to simultaneously reduce two major degradation artifacts found in mid-wavelength infrared microscopy imagery, namely the inherent focal-plane array nonuniformity noise and the scene defocus presented due to the point spread function of the infrared microscope. We correct both nuisances using a novel, recursive method that combines the constant range nonuniformity correction algorithm with a frame-by-frame deconvolution approach. The ability of the method to jointly compensate for both nonuniformity noise and blur is demonstrated using two different real mid-wavelength infrared microscopic video sequences, which were captured from two microscopic living organisms using a Janos-Sofradir mid-wavelength infrared microscopy setup. The performance of the proposed method is assessed on real and simulated infrared data by computing the root mean-square error and the roughness-laplacian pattern index, which was specifically developed for the present work.

Original languageEnglish
Pages (from-to)199-206
Number of pages8
JournalInfrared Physics and Technology
StatePublished - May 2018


  • Deconvolution
  • Image reconstruction-restoration
  • Infrared focal plane array
  • Microscopy
  • Nonuniformity correction


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