TY - GEN
T1 - Sparse Logistic Regression utilizing Cardinality Constraints and Information Criteria
AU - Urrutia, Gabriel
AU - Delgado, Ramon
AU - Carvajal, Rodrigo
AU - Katselis, Dimitrios
AU - Agüero, Juan C.
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/10/10
Y1 - 2016/10/10
N2 - In this paper we address the problem of estimating a sparse parameter vector that defines a logistic regression. The problem is then solved using two approaches: i) inequality constrained Maximum Likelihood estimation and ii) penalized Maximum Likelihood which is closely related to Information Criteria such as AIC. For the promotion of sparsity, we utilize a nonlinear constraint based on the ℓ0 (pseudo) norm of the parameter vector. The corresponding optimization problem is solved using an equivalent representation of the problem that is simpler to solve. We illustrate the benefits of our proposal with an example that is inspired by a gene selection problem in DNA microarrays.
AB - In this paper we address the problem of estimating a sparse parameter vector that defines a logistic regression. The problem is then solved using two approaches: i) inequality constrained Maximum Likelihood estimation and ii) penalized Maximum Likelihood which is closely related to Information Criteria such as AIC. For the promotion of sparsity, we utilize a nonlinear constraint based on the ℓ0 (pseudo) norm of the parameter vector. The corresponding optimization problem is solved using an equivalent representation of the problem that is simpler to solve. We illustrate the benefits of our proposal with an example that is inspired by a gene selection problem in DNA microarrays.
UR - http://www.scopus.com/inward/record.url?scp=84994289022&partnerID=8YFLogxK
U2 - 10.1109/CCA.2016.7587916
DO - 10.1109/CCA.2016.7587916
M3 - Conference contribution
AN - SCOPUS:84994289022
T3 - 2016 IEEE Conference on Control Applications, CCA 2016
SP - 798
EP - 803
BT - 2016 IEEE Conference on Control Applications, CCA 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Conference on Control Applications, CCA 2016
Y2 - 19 September 2016 through 22 September 2016
ER -