TY - JOUR
T1 - Three-dimensional characterization of Co/Pd multilayer thin films using resonant soft x-ray scattering
AU - Flewett, Samuel
AU - Mishra, Durgamadhab
AU - Mori, Thiago J.A.
AU - Günther, Christian M.
AU - Denardin, Juliano C.
AU - Oyarzún, Simón
AU - Michea, Sebastián
AU - Engel, Dieter
AU - Fohler, Manuel
AU - Rocha, Tulio C.R.
AU - Ovalle, Alexandra F.
AU - Núñez, Leandro T.A.
AU - Pfau, Bastian
AU - Escrig, Juan
AU - Eisebitt, Stefan
N1 - Funding Information:
S.F., L.N., and A.O. are grateful for funding from the Chilean Research Organization CONICYT under FONDECYT Iniciacion Grant No. 11130563. We acknowledge the Helmholtz Zentrum Berlin for use of the synchrotron facilities BESSY II. J.E. and J.C.D. acknowledge financial support from FONDECYT 1150952, 1140195, and from CONICYT Proyecto Basal FB0807, CEDENNA. S.O. gratefully acknowledges PAI-CONICYT Grant No. 79140036 and CONICYT Proyecto Basal USA1555 for financial support. We acknowledge LNNano/CNPEM for the facilities for hard x-ray reflectivity and MFM.
Publisher Copyright:
© 2017 American Physical Society.
PY - 2017/3/29
Y1 - 2017/3/29
N2 - In this work, we take a step toward nanometer resolution magnetic tomography, demonstrating the use of resonant magnetic x-ray scattering for three-dimensional (3D) characterization of Co/Pd multilayers. Trading coherence for x-ray flux, we measured magnetic scattering out to full period resolutions of 20 nm for incidence angles up to 75 from normal incidence, which was sufficient for a semiquantitative analysis of the 3D magnetic domain structure of such films. For the analysis of such patterns, we developed a scattering model based upon multiple plane propagation of the beam through the sample, taking into account the effects of multiple scattering not accounted for with Born or Rytov approximation based models. Our results demonstrate that 3D statistical characterization of nanoscale magnetic features is currently possible, and it is expected that the advent of high brilliance sources such as MAX IV in Sweden and SIRIUS in Brazil will provide the coherent flux necessary to permit the generalization of this work to nanometer resolution magnetic tomography.
AB - In this work, we take a step toward nanometer resolution magnetic tomography, demonstrating the use of resonant magnetic x-ray scattering for three-dimensional (3D) characterization of Co/Pd multilayers. Trading coherence for x-ray flux, we measured magnetic scattering out to full period resolutions of 20 nm for incidence angles up to 75 from normal incidence, which was sufficient for a semiquantitative analysis of the 3D magnetic domain structure of such films. For the analysis of such patterns, we developed a scattering model based upon multiple plane propagation of the beam through the sample, taking into account the effects of multiple scattering not accounted for with Born or Rytov approximation based models. Our results demonstrate that 3D statistical characterization of nanoscale magnetic features is currently possible, and it is expected that the advent of high brilliance sources such as MAX IV in Sweden and SIRIUS in Brazil will provide the coherent flux necessary to permit the generalization of this work to nanometer resolution magnetic tomography.
UR - http://www.scopus.com/inward/record.url?scp=85016994035&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.95.094430
DO - 10.1103/PhysRevB.95.094430
M3 - Article
AN - SCOPUS:85016994035
VL - 95
JO - Physical Review B
JF - Physical Review B
SN - 2469-9950
IS - 9
M1 - 094430
ER -